Measurement of the transient junction temperature in MOSFET devices under operating conditions

D. Barlini, Mauro Ciappa, Michel Mermet-Guyennet, Wolfgang Fichtner. Measurement of the transient junction temperature in MOSFET devices under operating conditions. Microelectronics Reliability, 47(9-11):1707-1712, 2007. [doi]

Authors

D. Barlini

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Mauro Ciappa

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Michel Mermet-Guyennet

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Wolfgang Fichtner

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