Measurement of the transient junction temperature in MOSFET devices under operating conditions

D. Barlini, Mauro Ciappa, Michel Mermet-Guyennet, Wolfgang Fichtner. Measurement of the transient junction temperature in MOSFET devices under operating conditions. Microelectronics Reliability, 47(9-11):1707-1712, 2007. [doi]

Abstract

Abstract is missing.