Jessica R. Baron, Eric K. Patterson, Jonathan Dupuy. Toward Efficient Capture of Spatially Varying Material Properties. In Erik Brunvand, James Tompkin 0001, editors, ACM SIGGRAPH 2023 Posters, SIGGRAPH 2023, Los Angeles, CA, USA, August 6-10, 2023. ACM, 2023. [doi]
Abstract is missing.