S. Barraud, P. Dollfus, S. Galdin, Raúl Rengel, María J. Martín, J. E. Velázquez. An lonised-impurity Scattering Model for 3D Monte Carlo Device Simulation with Discrete Impurity Distribution. VLSI Design, 2001(1):399-404, 2001. [doi]
Abstract is missing.