Alexandre Bartel, Benoit Baudry, Freddy Munoz, Jacques Klein, Tejeddine Mouelhi, Yves Le Traon. Model Driven Mutation Applied to Adaptative Systems Testing. In Fourth International IEEE Conference on Software Testing, Verification and Validation, ICST 2012, Berlin, Germany, 21-25 March, 2011, Workshop Proceedings. pages 408-413, IEEE Computer Society, 2011. [doi]
Abstract is missing.