Characterization of High-Speed (Above 50 MHz) Devices Using Advance ATE-Techniques, Results and Device Problems - researchr publication

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Steve Barton. Characterization of High-Speed (Above 50 MHz) Devices Using Advance ATE-Techniques, Results and Device Problems. In Proceedings International Test Conference 1989, Washington, D.C., USA, August 1989. pages 860-868, IEEE Computer Society, 1989.

Abstract is missing.

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