Evaluation of heavy-ion impact in bulk and FDSOI devices under ZTC condition

Walter E. Calienes Bartra, Y. Q. de Aguiar, Cristina Meinhardt, Andrei Vladimirescu, Ricardo Augusto da Luz Reis. Evaluation of heavy-ion impact in bulk and FDSOI devices under ZTC condition. Microelectronics Reliability, 76:655-659, 2017. [doi]

Abstract

Abstract is missing.