Bulk and FDSOI SRAM resiliency to radiation effects

Walter E. Calienes Bartra, Ricardo Augusto da Luz Reis, Costin Anghel, Andrei Vladimirescu. Bulk and FDSOI SRAM resiliency to radiation effects. In IEEE 57th International Midwest Symposium on Circuits and Systems, MWSCAS 2014, College Station, TX, USA, August 3-6, 2014. pages 655-658, IEEE, 2014. [doi]

Abstract

Abstract is missing.