Modeling the impact of heavy ion on FDSOI NanoCMOS

Walter E. Calienes Bartra, Ricardo Reis, Andrei Vladimirescu. Modeling the impact of heavy ion on FDSOI NanoCMOS. In IEEE 6th Latin American Symposium on Circuits & Systems, LASCAS 2015, Montevideo, Uruguay, February 24-27, 2015. pages 1-4, IEEE, 2015. [doi]

Abstract

Abstract is missing.