A Code Width Built-In-Self Test Circuit for 8-bit Pipelined ADC

Alok Barua, Md. Tausiff. A Code Width Built-In-Self Test Circuit for 8-bit Pipelined ADC. In Henry Selvaraj, Dawid Zydek, editors, 21st International Conference on Systems Engineering (ICSEng 2011), Las Vegas, NV, USA, Aug. 16-18, 2011. pages 287-291, IEEE, 2011. [doi]

Abstract

Abstract is missing.