Abhishek Basak, Fengchao Zhang, Swarup Bhunia. PiRA: IC authentication utilizing intrinsic variations in pin resistance. In 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015. pages 1-8, IEEE, 2015. [doi]
@inproceedings{BasakZB15, title = {PiRA: IC authentication utilizing intrinsic variations in pin resistance}, author = {Abhishek Basak and Fengchao Zhang and Swarup Bhunia}, year = {2015}, doi = {10.1109/TEST.2015.7342388}, url = {http://dx.doi.org/10.1109/TEST.2015.7342388}, researchr = {https://researchr.org/publication/BasakZB15}, cites = {0}, citedby = {0}, pages = {1-8}, booktitle = {2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015}, publisher = {IEEE}, isbn = {978-1-4673-6578-9}, }