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Elisabeth Baseman, Nathan DeBardeleben, Kurt B. Ferreira, Scott Levy, Steven Raasch, Vilas Sridharan, Taniya Siddiqua, Qiang Guan. Improving DRAM Fault Characterization through Machine Learning. In 46th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops, DSN Workshops 2016, Toulouse, France, June 28 - July 1, 2016. pages 250-253, IEEE Computer Society, 2016. [doi]

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