Elisabeth Baseman, Nathan DeBardeleben, Kurt B. Ferreira, Scott Levy, Steven Raasch, Vilas Sridharan, Taniya Siddiqua, Qiang Guan. Improving DRAM Fault Characterization through Machine Learning. In 46th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops, DSN Workshops 2016, Toulouse, France, June 28 - July 1, 2016. pages 250-253, IEEE Computer Society, 2016. [doi]
@inproceedings{BasemanDFLRSSG16,
title = {Improving DRAM Fault Characterization through Machine Learning},
author = {Elisabeth Baseman and Nathan DeBardeleben and Kurt B. Ferreira and Scott Levy and Steven Raasch and Vilas Sridharan and Taniya Siddiqua and Qiang Guan},
year = {2016},
doi = {10.1109/DSN-W.2016.13},
url = {http://doi.ieeecomputersociety.org/10.1109/DSN-W.2016.13},
researchr = {https://researchr.org/publication/BasemanDFLRSSG16},
cites = {0},
citedby = {0},
pages = {250-253},
booktitle = {46th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops, DSN Workshops 2016, Toulouse, France, June 28 - July 1, 2016},
publisher = {IEEE Computer Society},
isbn = {978-1-5090-3688-2},
}