Towards a chip level reliability simulator for copper/low-k backend processes

Muhammad Bashir, Linda S. Milor. Towards a chip level reliability simulator for copper/low-k backend processes. In Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010. pages 279-282, IEEE, 2010. [doi]

Authors

Muhammad Bashir

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Linda S. Milor

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