Iftekhar Ibne Basith, Nabeeh Kandalaft, Rashid Rashidzadeh. Built-In Self-Test for Capacitive MEMS Using a Charge Control Technique. In Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China. pages 135-140, IEEE Computer Society, 2010. [doi]
Abstract is missing.