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Investigating Root Causes of Authentication Failures Using a SAML and OIDC Observatory

Jim Basney, Phuong Cao, Terry Fleury. Investigating Root Causes of Authentication Failures Using a SAML and OIDC Observatory. In 6th IEEE International Conference on Dependability in Sensor, Cloud and Big Data Systems and Applications, DependSys 2020, Nadi, Fiji, December 14-16, 2020. pages 119-126, IEEE, 2020. [doi]

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Jim Basney

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Phuong Cao

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Terry Fleury

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