Jim Basney, Phuong Cao, Terry Fleury. Investigating Root Causes of Authentication Failures Using a SAML and OIDC Observatory. In 6th IEEE International Conference on Dependability in Sensor, Cloud and Big Data Systems and Applications, DependSys 2020, Nadi, Fiji, December 14-16, 2020. pages 119-126, IEEE, 2020. [doi]
@inproceedings{BasneyCF20,
title = {Investigating Root Causes of Authentication Failures Using a SAML and OIDC Observatory},
author = {Jim Basney and Phuong Cao and Terry Fleury},
year = {2020},
doi = {10.1109/DependSys51298.2020.00026},
url = {https://doi.org/10.1109/DependSys51298.2020.00026},
researchr = {https://researchr.org/publication/BasneyCF20},
cites = {0},
citedby = {0},
pages = {119-126},
booktitle = {6th IEEE International Conference on Dependability in Sensor, Cloud and Big Data Systems and Applications, DependSys 2020, Nadi, Fiji, December 14-16, 2020},
publisher = {IEEE},
isbn = {978-1-7281-7651-2},
}