Daniel Chicayban Bastos, Luis Antonio Brasil Kowada, Raphael C. S. Machado. Measuring randomness in IoT products. In 2nd Workshop on Metrology for Industry 4.0 and IoT MetroInd4.0&IoT 2019, Naples, Italy, June 4-6, 2019. pages 466-470, IEEE, 2019. [doi]
Abstract is missing.