Kanad Basu, Prabhat Mishra. Efficient trace data compression using statically selected dictionary. In 29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011, Dana Point, California, USA. pages 14-19, IEEE Computer Society, 2011. [doi]
@inproceedings{BasuM11,
title = {Efficient trace data compression using statically selected dictionary},
author = {Kanad Basu and Prabhat Mishra},
year = {2011},
doi = {10.1109/VTS.2011.5783748},
url = {http://dx.doi.org/10.1109/VTS.2011.5783748},
tags = {data-flow},
researchr = {https://researchr.org/publication/BasuM11},
cites = {0},
citedby = {0},
pages = {14-19},
booktitle = {29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011, Dana Point, California, USA},
publisher = {IEEE Computer Society},
}