Advances in electric charge measurements in semi-conducting structures by non-destructive thermal methods - researchr publication authors

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Sylvain Baudon, Petru Notingher, Serge Agnel, Stephane Hole. Advances in electric charge measurements in semi-conducting structures by non-destructive thermal methods. In 2014 IEEE Industry Application Society Annual Meeting, Vancouver, BC, Canada, October 5-9, 2014. pages 1-7, IEEE, 2014. [doi]

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