Sylvain Baudon, Petru Notingher, Serge Agnel, Stephane Hole. Advances in electric charge measurements in semi-conducting structures by non-destructive thermal methods. In 2014 IEEE Industry Application Society Annual Meeting, Vancouver, BC, Canada, October 5-9, 2014. pages 1-7, IEEE, 2014. [doi]
@inproceedings{BaudonNAH14,
title = {Advances in electric charge measurements in semi-conducting structures by non-destructive thermal methods},
author = {Sylvain Baudon and Petru Notingher and Serge Agnel and Stephane Hole},
year = {2014},
doi = {10.1109/IAS.2014.6978355},
url = {http://dx.doi.org/10.1109/IAS.2014.6978355},
researchr = {https://researchr.org/publication/BaudonNAH14},
cites = {0},
citedby = {0},
pages = {1-7},
booktitle = {2014 IEEE Industry Application Society Annual Meeting, Vancouver, BC, Canada, October 5-9, 2014},
publisher = {IEEE},
}