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Towards a Safe Use of Design Patterns to Improve OO Software Testability

Benoit Baudry, Yves Le Traon, Gerson Sunyé, Jean-Marc Jézéquel. Towards a Safe Use of Design Patterns to Improve OO Software Testability. In 12th International Symposium on Software Reliability Engineering (ISSRE 2001), 27-30 November 2001, Hong Kong, China. pages 324-331, IEEE Computer Society, 2001. [doi]

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Benoit Baudry

This author has not been identified. It may be one of the following persons: Look up 'Benoit Baudry' in Google

Yves Le Traon

This author has not been identified. It may be one of the following persons: Look up 'Yves Le Traon' in Google

Gerson Sunyé

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Jean-Marc Jézéquel

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