Bernhard Bauer, Mouadh Ayache, Saleh Mulhem, Meirav Nitzan, Jyotika Athavale, Rainer Buchty, Mladen Berekovic. On the Dependability Lifecycle of Electrical/Electronic Product Development: The Dual-Cone V-Model. IEEE Computer, 55(9):99-106, 2022. [doi]
Abstract is missing.