Lee Baugh, Craig B. Zilles. An Analysis of I/O And Syscalls In Critical Sections And Their Implications For Transactional Memory. In IEEE International Symposium on Performance Analysis of Systems and Software, ISPASS 2008, April 20-22, 2008, Austin, Texas, USA, Proceedings. pages 54-62, IEEE, 2008. [doi]
@inproceedings{BaughZ08,
title = {An Analysis of I/O And Syscalls In Critical Sections And Their Implications For Transactional Memory},
author = {Lee Baugh and Craig B. Zilles},
year = {2008},
doi = {10.1109/ISPASS.2008.4510738},
url = {http://dx.doi.org/10.1109/ISPASS.2008.4510738},
tags = {analysis},
researchr = {https://researchr.org/publication/BaughZ08},
cites = {0},
citedby = {0},
pages = {54-62},
booktitle = {IEEE International Symposium on Performance Analysis of Systems and Software, ISPASS 2008, April 20-22, 2008, Austin, Texas, USA, Proceedings},
publisher = {IEEE},
}