Automatic Generation of Critical Test Cases for the Development of Highly Automated Driving Functions

Daniel Baumann, Raphael Pfeffer, Eric Sax. Automatic Generation of Critical Test Cases for the Development of Highly Automated Driving Functions. In 93rd IEEE Vehicular Technology Conference, VTC Spring 2021, Helsinki, Finland, April 25-28, 2021. pages 1-5, IEEE, 2021. [doi]

Abstract

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