Christian Bayens, Tuan Le, Luis Garcia, Raheem A. Beyah, Mehdi Javanmard, Saman A. Zonouz. See No Evil, Hear No Evil, Feel No Evil, Print No Evil? Malicious Fill Patterns Detection in Additive Manufacturing. In Engin Kirda, Thomas Ristenpart, editors, 26th USENIX Security Symposium, USENIX Security 2017, Vancouver, BC, Canada, August 16-18, 2017. pages 1181-1198, USENIX Association, 2017. [doi]
@inproceedings{BayensLGBJZ17,
title = {See No Evil, Hear No Evil, Feel No Evil, Print No Evil? Malicious Fill Patterns Detection in Additive Manufacturing},
author = {Christian Bayens and Tuan Le and Luis Garcia and Raheem A. Beyah and Mehdi Javanmard and Saman A. Zonouz},
year = {2017},
url = {https://www.usenix.org/conference/usenixsecurity17/technical-sessions/presentation/bayens},
researchr = {https://researchr.org/publication/BayensLGBJZ17},
cites = {0},
citedby = {0},
pages = {1181-1198},
booktitle = {26th USENIX Security Symposium, USENIX Security 2017, Vancouver, BC, Canada, August 16-18, 2017},
editor = {Engin Kirda and Thomas Ristenpart},
publisher = {USENIX Association},
}