Christian Bayens, Tuan Le, Luis Garcia, Raheem A. Beyah, Mehdi Javanmard, Saman A. Zonouz. See No Evil, Hear No Evil, Feel No Evil, Print No Evil? Malicious Fill Patterns Detection in Additive Manufacturing. In Engin Kirda, Thomas Ristenpart, editors, 26th USENIX Security Symposium, USENIX Security 2017, Vancouver, BC, Canada, August 16-18, 2017. pages 1181-1198, USENIX Association, 2017. [doi]
Abstract is missing.