Jens Bayer, Stefan Becker, David Münch, Michael Arens, Jürgen Beyerer. Higher-Order Adversarial Patches for Real-Time Object Detectors. In Maria De Marsico, Tin Kam Ho, rédéric Jurie, Cheng-Lin Liu, Daniel P. Lopresti, Ingela Nyström, Jean-Marc Ogier, Arun Ross, Liang Wang 0001, editors, Pattern Recognition - 28th International Conference, ICPR 2026, Lyon, France, August 17-22, 2026, Proceedings, Part II. Volume 16813 of Lecture Notes in Computer Science, pages 622-634, Springer, 2026. [doi]
Abstract is missing.