Florian Bayer, Maximilian Russo, Christian Rathgeb. Training-free Dimensionality Reduction via Feature Truncation: Enhancing Efficiency in Privacy-preserving Multi-Biometric Systems. In IEEE International Joint Conference on Biometrics, IJCB 2025, Osaka, Japan, September 8-11, 2025. pages 1-10, IEEE, 2025. [doi]
Abstract is missing.