Improved fault diagnosis in scan-based BIST via superposition

Ismet Bayraktaroglu, Alex Orailoglu. Improved fault diagnosis in scan-based BIST via superposition. In DAC. pages 55-58, 2000. [doi]

@inproceedings{BayraktarogluO00:0,
  title = {Improved fault diagnosis in scan-based BIST via superposition},
  author = {Ismet Bayraktaroglu and Alex Orailoglu},
  year = {2000},
  doi = {10.1145/337292.337311},
  url = {http://doi.acm.org/10.1145/337292.337311},
  tags = {rule-based},
  researchr = {https://researchr.org/publication/BayraktarogluO00%3A0},
  cites = {0},
  citedby = {0},
  pages = {55-58},
  booktitle = {DAC},
}