An improved method for automatic detection and location of defects in electronic components using scanning ultrasonic microscopy - researchr publication authors

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Laurent Béchou, Dominique Dallet, Yves Danto, Pasquale Daponte, Yves Ousten, Sergio Rapuano. An improved method for automatic detection and location of defects in electronic components using scanning ultrasonic microscopy. IEEE T. Instrumentation and Measurement, 52(1):135-142, 2003. [doi]

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