Laurent Béchou, Dominique Dallet, Yves Danto, Pasquale Daponte, Yves Ousten, Sergio Rapuano. An improved method for automatic detection and location of defects in electronic components using scanning ultrasonic microscopy. IEEE T. Instrumentation and Measurement, 52(1):135-142, 2003. [doi]
@article{BechouDDDOR03,
title = {An improved method for automatic detection and location of defects in electronic components using scanning ultrasonic microscopy},
author = {Laurent Béchou and Dominique Dallet and Yves Danto and Pasquale Daponte and Yves Ousten and Sergio Rapuano},
year = {2003},
doi = {10.1109/TIM.2003.809071},
url = {http://dx.doi.org/10.1109/TIM.2003.809071},
researchr = {https://researchr.org/publication/BechouDDDOR03},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {52},
number = {1},
pages = {135-142},
}