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Modelling the Memory Impact of TSO and Batch Growth

Glen Becker. Modelling the Memory Impact of TSO and Batch Growth. In George W. Dodson, H. Pat Artis, Donald R. Deese, Bernard Domanski, Sidney Finehirsh, John Gaffney, Anneliese Amschler Andrews, editors, Ninth International Computer Measurement Group Conference, Washington, DC, USA, December 5-9, 1983, Proceedings. pages 390-397, Computer Measurement Group, 1983.

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