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Modelling the Memory Impact of TSO and Batch Growth

Glen Becker. Modelling the Memory Impact of TSO and Batch Growth. In Donald R. Deese, H. Pat Artis, Anneliese Amschler Andrews, Bernard Domanski, Sidney Finehirsh, Jason G. Shane, John Gaffney, editors, Tenth International Computer Measurement Group Conference, San Francisco, CA, USA, December 3-7, 1984, Proceedings. pages 683-690, Computer Measurement Group, 1984.

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