Bernd Becker, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, Hans-Joachim Wunderlich. Massive statistical process variations: A grand challenge for testing nanoelectronic circuits. In IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W 2010), Chicago, Illinois, USA, June 28 - July 1, 2010. pages 95-100, IEEE, 2010. [doi]
@inproceedings{BeckerHPSVW10,
title = {Massive statistical process variations: A grand challenge for testing nanoelectronic circuits},
author = {Bernd Becker and Sybille Hellebrand and Ilia Polian and Bernd Straube and Wolfgang Vermeiren and Hans-Joachim Wunderlich},
year = {2010},
doi = {10.1109/DSNW.2010.5542612},
url = {http://doi.ieeecomputersociety.org/10.1109/DSNW.2010.5542612},
researchr = {https://researchr.org/publication/BeckerHPSVW10},
cites = {0},
citedby = {0},
pages = {95-100},
booktitle = {IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W 2010), Chicago, Illinois, USA, June 28 - July 1, 2010},
publisher = {IEEE},
isbn = {978-1-4244-7729-6},
}