Bernd Becker, Ilia Polian, Sybille Hellebrand, Bernd Straube, Hans-Joachim Wunderlich. DFG-Projekt RealTest - Test und Zuverlässigkeit nanoelektronischer Systeme (DFG-Project - Test and Reliability of Nano-Electronic Systems). it - Information Technology, 48(5):304, 2006. [doi]
@article{BeckerPHSW06,
title = {DFG-Projekt RealTest - Test und Zuverlässigkeit nanoelektronischer Systeme (DFG-Project - Test and Reliability of Nano-Electronic Systems)},
author = {Bernd Becker and Ilia Polian and Sybille Hellebrand and Bernd Straube and Hans-Joachim Wunderlich},
year = {2006},
doi = {10.1524/itit.2006.48.5.304},
url = {http://dx.doi.org/10.1524/itit.2006.48.5.304},
tags = {testing, reliability},
researchr = {https://researchr.org/publication/BeckerPHSW06},
cites = {0},
citedby = {0},
journal = {it - Information Technology},
volume = {48},
number = {5},
pages = {304},
}