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DFG-Projekt RealTest - Test und Zuverlässigkeit nanoelektronischer Systeme (DFG-Project - Test and Reliability of Nano-Electronic Systems)

Bernd Becker, Ilia Polian, Sybille Hellebrand, Bernd Straube, Hans-Joachim Wunderlich. DFG-Projekt RealTest - Test und Zuverlässigkeit nanoelektronischer Systeme (DFG-Project - Test and Reliability of Nano-Electronic Systems). it - Information Technology, 48(5):304, 2006. [doi]

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