Transistor sizing of custom high-performance digital circuits with parametric yield considerations - researchr publication authors

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Daniel K. Beece, Jinjun Xiong, Chandu Visweswariah, Vladimir Zolotov, Yifang Liu. Transistor sizing of custom high-performance digital circuits with parametric yield considerations. In Sachin S. Sapatnekar, editor, Proceedings of the 47th Design Automation Conference, DAC 2010, Anaheim, California, USA, July 13-18, 2010. pages 781-786, ACM, 2010. [doi]

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