Simon Van Beek, Kaiming Cai, Kaiquan Fan, Giacomo Talmelli, Anna Trovato, Nico Jossart, Siddharth Rao, Adrian Vaisman Chasin, Sebastien Couet. MTJ degradation in multi-pillar SOT-MRAM with selective writing. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-7, IEEE, 2023. [doi]
@inproceedings{BeekCFTTJRCC23,
title = {MTJ degradation in multi-pillar SOT-MRAM with selective writing},
author = {Simon Van Beek and Kaiming Cai and Kaiquan Fan and Giacomo Talmelli and Anna Trovato and Nico Jossart and Siddharth Rao and Adrian Vaisman Chasin and Sebastien Couet},
year = {2023},
doi = {10.1109/IRPS48203.2023.10117917},
url = {https://doi.org/10.1109/IRPS48203.2023.10117917},
researchr = {https://researchr.org/publication/BeekCFTTJRCC23},
cites = {0},
citedby = {0},
pages = {1-7},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023},
publisher = {IEEE},
isbn = {978-1-6654-5672-2},
}