Maurice H. ter Beek, Alessandro Fantechi, Stefania Gnesi. Product line models of large cyber-physical systems: the case of ERTMS/ETCS. In Thorsten Berger, Paulo Borba, Goetz Botterweck, Tomi Männistö, David Benavides, Sarah Nadi, Timo Kehrer, Rick Rabiser, Christoph Elsner, Mukelabai Mukelabai, editors, Proceeedings of the 22nd International Systems and Software Product Line Conference - Volume 1, SPLC 2018, Gothenburg, Sweden, September 10-14, 2018. pages 208-214, ACM, 2018. [doi]
Abstract is missing.