Salomon Beer, Ran Ginosar, Michael Priel, Rostislav (Reuven) Dobkin, Avinoam Kolodny. An on-chip metastability measurement circuit to characterize synchronization behavior in 65nm. In International Symposium on Circuits and Systems (ISCAS 2011), May 15-19 2011, Rio de Janeiro, Brazil. pages 2593-2596, IEEE, 2011. [doi]
@inproceedings{BeerGPDK11,
title = {An on-chip metastability measurement circuit to characterize synchronization behavior in 65nm},
author = {Salomon Beer and Ran Ginosar and Michael Priel and Rostislav (Reuven) Dobkin and Avinoam Kolodny},
year = {2011},
doi = {10.1109/ISCAS.2011.5938135},
url = {http://dx.doi.org/10.1109/ISCAS.2011.5938135},
tags = {synchronization},
researchr = {https://researchr.org/publication/BeerGPDK11},
cites = {0},
citedby = {0},
pages = {2593-2596},
booktitle = {International Symposium on Circuits and Systems (ISCAS 2011), May 15-19 2011, Rio de Janeiro, Brazil},
publisher = {IEEE},
}