Expected Value and Variance of the Indirect Time-of-Flight Measurement With Dead Time Afflicted Single-Photon Avalanche Diodes - researchr publication authors

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Maik Beer, Olaf M. Schrey, Bedrich J. Hosticka, Rainer Kokozinski. Expected Value and Variance of the Indirect Time-of-Flight Measurement With Dead Time Afflicted Single-Photon Avalanche Diodes. IEEE Trans. on Circuits and Systems, 65-I(3):970-981, 2018. [doi]

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