Maik Beer, Olaf M. Schrey, Bedrich J. Hosticka, Rainer Kokozinski. Expected Value and Variance of the Indirect Time-of-Flight Measurement With Dead Time Afflicted Single-Photon Avalanche Diodes. IEEE Trans. on Circuits and Systems, 65-I(3):970-981, 2018. [doi]
@article{BeerSHK18,
title = {Expected Value and Variance of the Indirect Time-of-Flight Measurement With Dead Time Afflicted Single-Photon Avalanche Diodes},
author = {Maik Beer and Olaf M. Schrey and Bedrich J. Hosticka and Rainer Kokozinski},
year = {2018},
doi = {10.1109/TCSI.2017.2752860},
url = {https://doi.org/10.1109/TCSI.2017.2752860},
researchr = {https://researchr.org/publication/BeerSHK18},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on Circuits and Systems},
volume = {65-I},
number = {3},
pages = {970-981},
}