Point of Sale Fraud Detection Methods via Machine Learning

Emre Begen, Ismail Utku Sayan, Ahmet Tugrul Bayrak, Olcay Taner Yildiz. Point of Sale Fraud Detection Methods via Machine Learning. In Tulay Yildirim, Richard Chbeir, Ladjel Bellatreche, Costin Badica, editors, International Conference on Innovations in Intelligent Systems and Applications, INISTA 2023, Hammamet, Tunisia, September 20-23, 2023. pages 1-5, IEEE, 2023. [doi]

Authors

Emre Begen

This author has not been identified. Look up 'Emre Begen' in Google

Ismail Utku Sayan

This author has not been identified. Look up 'Ismail Utku Sayan' in Google

Ahmet Tugrul Bayrak

This author has not been identified. Look up 'Ahmet Tugrul Bayrak' in Google

Olcay Taner Yildiz

This author has not been identified. Look up 'Olcay Taner Yildiz' in Google