Emre Begen, Ismail Utku Sayan, Ahmet Tugrul Bayrak, Olcay Taner Yildiz. Point of Sale Fraud Detection Methods via Machine Learning. In Tulay Yildirim, Richard Chbeir, Ladjel Bellatreche, Costin Badica, editors, International Conference on Innovations in Intelligent Systems and Applications, INISTA 2023, Hammamet, Tunisia, September 20-23, 2023. pages 1-5, IEEE, 2023. [doi]
Abstract is missing.