Wafer defect identification with optimal hyper-parameter tuning of support vector machine using the deep feature of ResNet 101 - researchr publication

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Santi Kumari Behera, Shishir Prasad Dash, Rajat Amat, Prabira Kumar Sethy. Wafer defect identification with optimal hyper-parameter tuning of support vector machine using the deep feature of ResNet 101. Int. J. Systems Assurance Engineering and Management, 15(3):1294-1304, March 2024. [doi]

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