Payman Behnam, Bijan Alizadeh. In-Circuit Mutation-Based Automatic Correction of Certain Design Errors Using SAT Mechanisms. In 24th IEEE Asian Test Symposium, ATS 2015, Mumbai, India, November 22-25, 2015. pages 199-204, IEEE, 2015. [doi]
@inproceedings{BehnamA15,
title = {In-Circuit Mutation-Based Automatic Correction of Certain Design Errors Using SAT Mechanisms},
author = {Payman Behnam and Bijan Alizadeh},
year = {2015},
doi = {10.1109/ATS.2015.41},
url = {http://dx.doi.org/10.1109/ATS.2015.41},
researchr = {https://researchr.org/publication/BehnamA15},
cites = {0},
citedby = {0},
pages = {199-204},
booktitle = {24th IEEE Asian Test Symposium, ATS 2015, Mumbai, India, November 22-25, 2015},
publisher = {IEEE},
isbn = {978-1-4673-9739-1},
}