Edith Beigné, Alexandre Valentian, Bastien Giraud, Olivier Thomas, T. Benoist, Yvain Thonnart, Serge Bernard, G. Moritz, O. Billoint, Y. Maneglia, Philippe Flatresse, Jean-Philippe Noel, Fady Abouzeid, Bertrand Pelloux-Prayer, A. Grover, Sylvain Clerc, Philippe Roche, Julien Le Coz, Sylvain Engels, Robin Wilson. Ultra-wide voltage range designs in fully-depleted silicon-on-insulator FETs. In Enrico Macii, editor, Design, Automation and Test in Europe, DATE 13, Grenoble, France, March 18-22, 2013. pages 613-618, EDA Consortium San Jose, CA, USA / ACM DL, 2013. [doi]
@inproceedings{BeigneVGTBTBMBMFNAPGCRCEW13,
title = {Ultra-wide voltage range designs in fully-depleted silicon-on-insulator FETs},
author = {Edith Beigné and Alexandre Valentian and Bastien Giraud and Olivier Thomas and T. Benoist and Yvain Thonnart and Serge Bernard and G. Moritz and O. Billoint and Y. Maneglia and Philippe Flatresse and Jean-Philippe Noel and Fady Abouzeid and Bertrand Pelloux-Prayer and A. Grover and Sylvain Clerc and Philippe Roche and Julien Le Coz and Sylvain Engels and Robin Wilson},
year = {2013},
url = {http://dl.acm.org/citation.cfm?id=2485440},
researchr = {https://researchr.org/publication/BeigneVGTBTBMBMFNAPGCRCEW13},
cites = {0},
citedby = {0},
pages = {613-618},
booktitle = {Design, Automation and Test in Europe, DATE 13, Grenoble, France, March 18-22, 2013},
editor = {Enrico Macii},
publisher = {EDA Consortium San Jose, CA, USA / ACM DL},
isbn = {978-1-4503-2153-2},
}