Yury S. Bekhtin, Alexey A. Lupachev, Andrey N. Serov, Andrey V. Kovalenko. Analysis of interval criteria for determining the end of the transient process in the measuring circuit. In 7th Mediterranean Conference on Embedded Computing, MECO 2018, Budva, Montenegro, June 10-14, 2018. pages 1-4, IEEE, 2018. [doi]
Abstract is missing.