RF performance reliability of power N-LDMOS under pulsed-RF aging life test in radar application S-band

Mohamed Ali Belaïd, Ahmed Almusallam, Mohamed Masmoudi. RF performance reliability of power N-LDMOS under pulsed-RF aging life test in radar application S-band. IET Circuits, Devices & Systems, 14(6):805-810, 2020. [doi]

Abstract

Abstract is missing.